Abstract
Well-aligned TiO 2 nanocrystals (NCs) were prepared by metalorganic chemical vapour deposition on sapphire (SA) (100) and (012) substrates, using Ti[OCH(CH 3) 2]4 as precursor. The surface morphology, structural and spectroscopic properties of the deposited NCs were characterized using field emission scanning electron microscopy (FESEM), X-ray diffractometry (XRD) and Raman spectroscopy (RS). FESEM micrographs show that the NCs on SA(IOO) are vertically aligned. XRD determines the preferable orientations of the as-deposited NCs. RS confirms rutile phase of the NCs. The roles of substrate orientations for the formation of different textures of TiO 2 NCs are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | S332-S335 |
| Journal | Journal of Materials Science: Materials in Electronics |
| Volume | 20 |
| Issue number | SUPPL. 1 |
| DOIs | |
| State | Published - Jan 2009 |
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