Surface characterization of extracellular matrix scaffolds

Bryan N. Brown, Christopher A. Barnes, Rena T. Kasick, Roger Michel, Thomas W. Gilbert, Donna Beer-Stolz, David G. Castner, Buddy D. Ratner, Stephen F. Badylak*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

153 Scopus citations

Abstract

Extracellular matrix (ECM) scaffolds prepared from different tissue sources or using different methods have been demonstrated to have distinctive effects upon cell adhesion patterns and the ability to support and maintain differentiated phenotypes. It is unknown whether the molecular composition or the ultrastructure of the ECM plays a greater role in determining the phenotype of the cells with which it comes into contact. However, when implanted, the topology and ligand landscape of the material will determine the host molecules that bind and the type and behavior of cells that mediate the host response. Therefore, a comprehensive understanding of surface characteristics is essential in the design of scaffolds for specific clinical applications. The surface characteristics of ECM scaffolds derived from porcine urinary bladder, small intestine, and liver as well as the effects of two commonly used methods of chemical cross-linking upon UBM were investigated. Electron microscopy and time of flight secondary ion mass spectroscopy were used to examine the surface characteristics of the scaffolds. The results show that ECM scaffolds have unique morphologic and structural properties which are dependant on the organ or tissue from which the scaffold is harvested. Furthermore, the results show that the surface characteristics of an ECM scaffold are changed through chemical cross-linking.

Original languageEnglish
Pages (from-to)428-437
Number of pages10
JournalBiomaterials
Volume31
Issue number3
DOIs
StatePublished - Jan 2010
Externally publishedYes

Keywords

  • Cross-linking, Surface analysis
  • ECM (Extracellular matrix)
  • SEM (Scanning electron microscopy)
  • Scaffold
  • ToF-SIMS (Time of flight secondary ion mass spectroscopy)

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